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P-737 PIFOC Sample Focusing Z Stage

Thin long-stroke piezo Z nanopositioner for microscope specimens. Stroke up to 250μm (customizable up to 500μm).

The PIFOC(R) P-737 high-speed vertical positioning system is designed for use with XY stages in microscope inspection. 【Features】 ○ High-speed piezo operation in the vertical direction: Stroke up to 250μm (customizable up to 500μm) ○ Nanometer resolution ○ Accommodates specimen holding with a large central opening ○ Mechanically compatible with manual or motor-driven XY OEM stages ○ Response time in the millisecond range ● For more details, please contact us or refer to the catalog.

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  • Focusing Z Stage

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P-737 Sample Focusing Z Stage for Microscopes

High-precision PIFOC Z stage for achieving high-speed focusing in microscopes.

In the field of research using microscopes, high-speed and high-precision focusing significantly impacts the quality of observation results and the reproducibility of acquired data. Particularly in 3D imaging and Z-stack acquisition using confocal and fluorescence microscopes, high-speed Z positioning with nanometer resolution is required. The P-737 PIFOC Z stage employs a piezo-flexure structure that directly drives the objective lens, achieving high-speed response and high-precision Z-axis control. Its compact design makes it easy to integrate into existing microscope systems, meeting the advanced focusing requirements in research applications. 【Usage Scenarios】 - 3D imaging with confocal microscopes - Z-stack acquisition with fluorescence microscopes - Live cell imaging - Observation of nanoscale structures 【Benefits of Implementation】 - Reduced measurement time through high-speed Z scanning - High-precision focusing with nanometer resolution - Highly reproducible imaging - Easy integration into microscope systems

  • P-737.jpg
  • Other microscopes
  • Focusing Z Stage

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